Influence of Embedded a-Si:H Layer Location on Floating-gate a-Si:H TFT Memory Functions

Center for Nuclear Security Science and Policy Initiatives

Texas A&M Engineering Experiment Station

Influence of Embedded a-Si:H Layer Location on Floating-gate a-Si:H TFT Memory Functions

Citation:

Y. Kuo and M. Coan, “Influence of Embedded a-Si:H Layer Location on Floating-gate a-Si:H TFT Memory Functions”, Materials Research Society Symposium Proceedings, San Francisco, CA, 5-10 April 2010.

Abstract:

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Associated Project:

1. SHIELD (Smuggled HEU Interdiction through Enhanced anaLysis and Detection): A Framework for Developing Novel Detection Systems Focused on Interdicting Shielded HEU